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Founded
in 1988, Micro Materials have been one of the world leaders in the
field of nano-mechanical measurements for over a decade. The
NanoTest™ is recognised as the most versatile instrument
currently available. Its unique modular concept allows the
researcher the opportunity to completely specify their system
configuration to suit their own research needs.
To measure nanomechanical properties, a very small calibrated
diamond probe is brought into contact with the sample surface and
a load is applied by means of a coil and magnet located at the top
of the pendulum. The resultant displacement of the probe into the
surface is monitored with a sensitive capacitive transducer and
displayed in real time as a function of load. To produce accurate
nano-hardness and modulus results, all instrument calibrations are
performed automatically
Measurable
properties:
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Adhesive
failure
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Creep
and relaxation
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Contact
fatigue
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Fracture
toughness
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Impact
resistance
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Loss
and storage moduli
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Nanoscale
wear resistance
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Stress-strain
data
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Surface
friction and topography
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True
thin film hardness and modulus
The Micro Materials NanoTest platform has been designed to support
our three modules of:
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Indentation
for nanoindentation, nano- and micro-hardness testing, reduced
modulus...
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Scratch
for scratch testing, thin film wear resistance...
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Impact
for thin film adhesion failure, erosive wear and contact
fatigue...
The
modular design allows you to choose the NanoTest for your specific
needs. The NanoTest can be easily upgraded and expanded with new
developments. Its reliability and precision are proving equally
popular in fundamental research studies as they are in quality
applications.
Choose
the Micro Materials NanoTest System for...
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Reliability
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Performance
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Versatility
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Upgradeability
Options
for the NanoTest include...
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High
Temperature Stage
Room temperature to over 500°C sample heating stage, probe
heater, thermal barrier and high temperature capacitor
assembly. For high temperature nanoindentation, scratch and
impact testing.
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Intermittent
Contact (AC) Atomic Force Microscope
Highly linear up to 200 x 200 µm SPM scanner with Z
range up to 15 µm. 0.5% vertical linearity across whole
scan range. AC (non-contact and intermittent contact mode) and
DC (Contact, Lateral Force) modes. Cantilever end radius
<20nm.
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MicroTest
High Load Head
Load ranges
0-2 N and 0-20 N. Can be fitted alongside the NanoTest head.
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Nanopositioner
In-situ 3D
imaging and scanning with integrated XYZ piezo Flexure stage.
200mm x 200mm x 20mm x,y,z stage; x,y stage resolution 2nm; z
resolution 0.1nm; closed loop linearity 0.03%.
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Continuous
Contact Compliance Calculation
Lock-in
amplifier and sample oscillation system. Oscillation frequency
range up to 250 Hz.
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Spherical
Indentation Package
Spherical
indenter and analysis software to calculate plastic depth,
hardness vs. penetration depth, creep and stress-strain.
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Automatic
2D Sample Levelling Stage
Recommended
for hardness/modulus and essential for roughness/topography on
curved/uneven samples.
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High
Resolution and x230 Microscopes and Video Capture
High
resolution x1250 with accurate repositioning and sample
translation. Video x230 magnification. Video or USB capture
features to allow for image storage.
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Pin-on-Disk
<<1
rpm - 3600 rpm pin-on-disk assembly with high torque motor and
gearbox, and software for control of speed, acceleration,
time, load, depth and track location.
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Humidity
Control System
Constant
temperature, 25-80 % RH control unit, designed to operate with
a thermally insulated environmental chamber.
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Acoustic
Emission System
Acoustic
emission system with shielded detector, for use with
indentation or scratching modules.
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Adhesion
Software
Compressive adhesion testing software to load-unload sample
and measure pull-off forces.
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